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MQ Photonics Research Centre

James Downes

Department of Physics and Astronomy
Faculty of Science
Macquarie University NSW 2109

Profile Photo
Email james.-downesmq.-edu.-au
Position Senior Lecturer; Degree Director Physics
Room No. E6B 2.710
Fax +61-2-9850-8115


James Downes (B.Sc. (Hons) Victoria University 1995, Ph.D. Boston University 2004) is a Lecturer in the Department of Physics. His research involves the thin-film growth of novel semiconductor materials and the study of their electronic structure using synchrotron-based techniques. In particular his research on organic semiconductors concentrates on understanding the interactions at organic-organic and organic-metal interfaces, and learning how to modify these interfaces in a controlled manner using photo-chemical techniques. James Downes' research on III-V and rare-earth nitride materials is centred on using synchrotron-based soft x-ray emission and absorption spectroscopies to understand the detailed electronic structure of these materials, with a view to enhancing their properties for use in optoelectronic and spintronic applications. He maintains strong collaborative links with School of Chemical and Physical Sciences, Victoria University / Macdiarmid Institute (NZ), the Novel Materials Laboratory at Boston University (USA), and the Physics Department of Trinity College (Ireland), and regularly travels to use international synchrotron facilities in the US (NSLS, Brookhaven National Lab.) and Sweden (MAXlab).

James Downes is the Director of First Year Physics and Director of BSc/BA (Physics).

Recent Selected Publications

  • Electronic Structure in Thin Film Organic Semiconductors studied using Soft X-Ray Emission and Resonant Inelastic X-Ray Scattering Y. Zhang, J.E. Downes, S. Wang, T. Learmonth, L. Plucinski, A.Y. Matsuura, C. McGuinness, P.-A. Glans, S. Bernardis, and K.E. Smith, (in press, Thin Solid Films, 2006).
  • Optical Conductivity and X-ray Absorption and Emission Study of the Band Structure of MnN Films S Granville, B. J. Ruck, F. Budde, A. Koo, J. E. Downes, H. J. Trodahl, A. Bittar, N. Strickland, G. Williams, W. L. Lambrecht, K. E. Smith, T. Learmonth, V. J. Kennedy, A. Markwitz, T. Schmitt, Physical Review B 72, 205127 (2005).
  • Electronic excitations in vanadium oxide phthalocyanine studied via resonant soft X-ray emission and resonant inelastic X-ray scattering Y. Zhang, S. Wang, T. Learmonth, L Plucinski, A Matsuura, S. Bernardis, C. O'Donnell, J. E. Downes, and K. E. Smith, Chemical Physics Letters 413, 95, (2005)
  • X-ray spectroscopic study of the electronic structure of the high-dielectric-constant material CaCu3Ti4O12 C. McGuinness, J.E. Downes, P. Sheridan, P.-A. Glans, K.E. Smith, W. Si, and P.D. Johnson, Physical Review B. 71, 195111 (2005).
  • Electronic structure near the Fermi level of the organic semiconductor copper phthalocyanine J. E. Downes, C. McGuinness, P.A. Glans, T. Learmonth, D. Fu, P. Sheridan, and K. E. Smith, Chemical Physics Letters, 390, 203-7 (2004).
  • Surface electronic structure of the organic superconductor kappa-(ET)2Cu(NCS)2 studied via photoemission electron microscopy J.E. Downes, K.E. Smith, A.Y. Matsuura, I. Lindau, and J.A. Schlueter, Surface Science, 551, 219 (2004).
  • Surface degradation of InxGa1-xN thin films by sputter-anneal processing: A scanning photoemission microscope study J.E. Downes, K.E. Smith, A.Y. Matsuura, I. Lindau, E. Iliopoulos, and T.D. Moustakas, Journal of Applied Physics 94, 5820 (2003).
  • Influence of shallow core level hybridization on the electronic structure of post-transition metal oxides studied using soft x-ray emission and absorption C. McGuinness, C.B. Stagarescu, P.J. Ryan, J.E. Downes, D. Fu, K.E. Smith, and R. Egdell, Physical Review B, 68, 165104-5113 (2003).
  • Electronic structure of thin film silicon oxynitrides measured using soft x-ray emission and absorption C. McGuinness, D. Fu, J. E. Downes, K. E. Smith, G. Hughes, and J. Roche, Journal of Applied Physics 94, 3919 (2003).
  • Soft x-ray emission and resonant inelastic x-ray scattering studies of transition metal oxides K. E. Smith, C. McGuinness, J. Downes, P. Ryan, D. Fu, S. L. Hulbert, J. M. Honig, and R. G. Egdell, Materials Research Society Proceedings, 755 DD1.1.1 (2003).
  • Measurements of anisotropic thermopower of magnetically aligned YBa2Cu3O7-delta ceramics: evidence of successful texturing techniques C. J. Liu, T. W. Wu, J. Downes , and M. P. Staines, Physica C, 390 (4), 374 (2003).
  • X-ray spectroscopic studies of the bulk electronic structure of InGaN alloys C. McGuinness, J.E. Downes, P. Ryan, K.E. Smith, D. Doppalapudi, and T.D. Moustakas, Nitride Semiconductors Symposium, Materials Research Society (2003).
  • Band-gap evolution, hybridization, and thermal stability of InxGa1-xN alloys measured by soft x-ray emission and absorption P. Ryan, J. Downes, C. McGuinness, K.E. Smith, A. Sampath and T.D. Moustakas, Physical Review B 65, 205201 (2002).
  • Resonant soft x-ray emission spectroscopy of V2O3, VO2 and NaV2O5 T. Schmitt, L.-C. Duda, A. Augustsson, J.-H. Guo, J. Nordgren, J.E. Downes, C. McGuinness, K.E. Smith, G. Dhalenne, A. Revcolevschi, M. Klemm, and S. Horn, Surface Review and Letters 9, 1369 (2002).
  • Surface Electronic Structure of p-type GaN(0001) P. Ryan, Y.-C. Chao, J. Downes, C. McGuinness, K.E. Smith, A.V. Sampath and T.D. Moustakas, Surface Science Letters 467, L827 (2000).
  • Bandlike and excitonic states of oxygen in CuGeO3: Observation using polarized resonant soft x-ray emission spectroscopy L.-C. Duda, J. Downes, C. McGuinness, T. Schmitt, A. Augustsson, K.E. Smith, G. Dhalenne, and A. Revcolevschi, Physical Review B. 61, 4186 (2000).
  • Observation of highly dispersive surface states on GaN(0001) Y.C. Chao, C.B. Stagarescu, J.E. Downes, P. Ryan, K.E. Smith, D. Hanser, M.D. Bremser, and R.F. Davis, Physical Review B 59, 15586 (1999).
  • Spectroscopic studies of the electronic structure of wurtzite GaN and AlxGa1-xN K.E. Smith, L.-C Duda, C.B Stagarescu, S.S. Dhesi, J. Downes, R. Singh, D. Doppalapudi, T.D. Moustakas, J.H. Guo, J. Nordgren, T. Valla, P.D. Johnson, Proceedings of the Third Symposium on III-V Nitride Materials and Processes, 50 (1999).
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